Semiconductor Macro Inspection Equipment (iFocus)
Using two inspection cameras for semiconductor wafer inspection equipment, the tact time has been reduced by half. 3D bump inspection is also possible.
Using patented OTF (On the Fly) technology and two inspection cameras to simultaneously capture bright and dark fields, the inspection process time is reduced by half. Additionally, 3D inspections are possible, enabling the inspection of coplanarity for bumps used in WLSCP packages and others.
- Company：CCTECH Japan CCTECH Japan（株）- 日本法人
- Price：Other
